Sophisticated Analytical Instrument Facilty (SAIF)

Sophisticated Analytical Instrument Facility (SAIF), was established at the Karnatak University, Dharwad in 2014 with the financial support from the Department of Science and Technology (DST), Government of India, with the following objectives:

  • To provide services of facilities of sophisticated analytical instruments to scientists and academicians from academic institutes, R&D laboratories and industries to enable them to carry out measurements for R&D work.
  • To acquire and develop capability for preventive maintenance and repair of sophisticated instruments.
  • To organize short term courses/workshops on the use and application of various instruments.

SAIF centre houses the following instruments:

  1. 400 MHz FT-NMR Spectrometer
  2. SEM with EDS & essential sample preparation accessories
  3. X-Ray Diffractometer (Powder) with accessories
  4. CD Spectrometer

The facilities provided by the SAIF may be utilized by any user/organization on payment of nominal charges. The details about the procedure for the submission of the samples and the charges for sample analysis can be obtained from the University website ( or from SAIF centre, Karnatak University, Dharwad. Online registration and online payment is mandatory.

The day-to-day functioning of the SAIF is overseen by Prof. J Seetharamappa Head, SAIF. The Facilities Management Committee (FMC) oversees and guides the activities of the SAIF.

Payment of Service / Analysis Charges

For DST‐SAIF facilities: Account holder: SAIF KUD USER CHARGES ACCOUNT,SB A/c No. 12062010023433, Canara Bank; Karnatak University Campus, Dharwad. (IFSC:CNRB0011206).

1. 400 MHz FT-NMR Spectrometer (Model: JNM- ECZ 400S)

Auto Tune Probe: With auto tuning unit, automatically tuning is done for multiple nuclei

Observations Nuclei: 1H, 13C, 19F, 31P to 15N, 39K and 109Ag

Type of Experiments: 1D and 2D NMR spectra of all active nuclei, DEPT, APT, Cosy, Cosy with or without gradient, TOCSY,NOESY, HMQC and HMBC


Resolution: High vacuum mode: 3.0 nm (30 kV) 15.0 nm (1.0 kV) Low vacuum mode: 4.0 nm (30 kV BED)

Accelerating Voltage: From 0.3KV-30KV in 1KV step

Magnification: 8X (WD 48mm) to 300000X

Detector: Secondary Electron Detector (SED), Backscattered Electron Detector (BED), Low Vacuum Secondary Electron Detector (LSED), Energy Dispersive X-ray Spectrometer (EDS)

Accessories: Critical point drier, Ion sputter system, Carbon coating unit

3. X-ray Diffractometer (Powder) (Model: SmartLab SE)

Fully automated alignment under computer control
SAXS capabilities
Optional D/teXUltra high-speed, position-sensitive detector system
2Θ: 2° to 150°

4. CD Spectrometer (Model: J-1500, Make: Jasco)


Xenon arc lamp source
Two quartz cell path lengths, 1mm and 1cm possible
Temperature ramping (-40o to 130oC) and thermal denaturation for screening binding
Wide spectral range from vacuum UV to Near-IR (163 to 1600 nm)

Sl No. Instrument Measurement Charges per sample in Rs.
Internal User(KUD Students) External Users (Students from other Colleges / Institutions/Universities) Private Industry / Research Organizations / National Labs / PSU
1 SEM with EDS (JEOL make, JSM-IT500LA)
Staff in charge: Mr. Raju Shivalli,
SEM Imaging 250/- 500/- +18% GST 700/- +18% GST
EDS 150/- 300/- +18% GST 400/- +18% GST
Mapping 200/- 350/- +18% GST 500/- +18% GST
2 Powder X-ray Diffractometer (Smart lab SE)
Staff in charge: Mr. Akash Badami,
XRD 300/- 500/- +18% GST 700/- +18% GST
Phase Identification 150/- 300/- +18% GST 400/- +18% GST
3 400 MHz FT-NMR (JEOL make JNM-ECZ400S)
Staff in charge: Mr. Pavan Bennur,
Proton 250/- 300/- +18% GST 500/- +18% GST
Proton & Carbon spectra 400/- 500/- +18% GST 1000/- +18% GST
4 CD Spectrometer (Jasco J-1500)
Staff in charge: Mr. Pavan Bennur,
Circular Dichroism 50 Per Sample (Up to 5 scans) 100/- +18% GST Per Sample (Up to 5 scans) 300/- +18% GST Per Sample (Up to 5 scans)
5 Liquid Nitrogen Plant (LN40WC)
Staff in charge: Mr. Pavan Bennur,
30/- Per Ltr 50/- Per Ltr 75/- Per Ltr

Instrument facilities available at
Sl.No. Instrument Make/Model Major Specifications / Accessories available Type of measurement / Analysis available
1 FT-NMR Spectrometer Jeol 400 MHz / JNM- ECZ 400S Operating Frequency:400 MHz Probe,-800C to 1500C temperature Auto sample changer with handling capacity of 30 samples Structure identification of organic, inorganic and polymer materials 1D and 2D NMR spectra of all active nuclei, DEPT, APT, Cosy,Cosy with or without gradient, TOCSY, NOESY, HMQC, HMBC etc.
2 X-ray Diffractometer (Powder) Rigaku Smartlab SE Fully automated computerized powder XRD; X-ray tube: CuAngular range (2θ) : 2° to 150° 2θ vs intensity plots / X-ray diffractograms; Quantitative analysis and other studies including phase identification, unit cell parameter determination, Particle size determination etc.
3 Scanning Electron Microscope with EDS Jeol JSM / JSM-IT500LA Magnification up to 3,00,000 X Resolution : 3nm Acc. Voltage up to 30kV Max. specimen size: 200mm Dia X 75mm height Fully computer controlled Carbon, Gold coating Surface topographic / morphological studies of microstructures on bulk specimens of biological or other materials ; SEI, BEI images; image Analysis etc.
4 CD Spectrometer Jasco/J-1500 Xenon arc lamp source Temperature ramping (-400 to 1300C) and thermal denaturation for screening binding High speed scanning (10000 nm/min) Identifying structural aspects of proteins and DNA. Determine how similar a wild type protein is to mutant or show the extent of denaturation with a change in temperature or chemical environment. Studies on chiral molecule etc.


Pavatenagar, Dharwad-580 003
E-mail : or
phone : 0836-2215295

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